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Showing results: 2746 - 2760 of 17041 items found.

  • Asynchronous System Level Test Platform

    Titan - Teradyne, Inc.

    The Titan System Level Test (SLT) platform delivers maximum flexibility, scalability and density in semiconductor test environments that require the highest levels of system performance testing. Titan is Teradyne’s solution for high-volume mobile application processor SLT requirements.

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  • Automated I-V/AOI/EL and Sorting System

    OAI

    OAI’s High Performance In-line Automated-I-V Testing, AOI/EL Inspection and Sorting/Binning System for Various Si Solar Cells. The 10000A-I-V System is a unique and reliable I-V testing, AOI/EL Inspection and Sorting / Binning system for testing of Mono, Multi-Si, C-HJT and other full Size (156mm x 156mm) and/or Cut-cell (156mm x 39mm or 156mm x 31.2mm or other custom sizes) Si Solar Cells.

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  • Trinocular Stereo Zoom Microscope Systems

    Sciencescope International

    Trinocular Stereo Zoom Microscope Systems are some of the best in the industry. We offer three different types of systems – our SSZ-II Series, NZ Series, and E-Series. Optical Zoom Range: 2x – 480x. Video Zoom Range: 7x – 628x.

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  • Watchdog Timer and System Monitor Card

    PCIe-WDG-CSMA - Acces I/O Products, Inc.

    This multifunction Low Profile x1 PCI Express card contains a watchdog timer used to monitor the operation of your application program and operating system to initiate a system reset in case of a lockup. It can also monitor and control a variety of system hardware parameters. The card is 6.6 inches long and 2.535 inches seated height. I/O wiring connections are via a female DB25 connector on the card mounting bracket. Two models with increasing features are available.

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  • X-ray Inspection System, Large Container

    SideChek / SideChek PLUS Series - Mettler-Toledo, LLC

    The SideChek range of single beam x-ray systems are designed to meet the high speed and high coverage needs of the food processing and packaging industries. Dedicated x-ray systems for a wide range of container sizesDepending on the largest container size that will run on a production line either the 300 or 400 model of the SideChek x-ray system range can be selected. The x-ray beam geometry is fixed on these two models and any container that fits inside the fixed beam angle can be inspected.

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  • Visible / Infrared / Imaging Test System

    System 1808 - Pulse Instruments

    Testing Low-voltage CCDs and IR FPAs; Military, science-grade and medical CCDs or IR FPAs; CMOS ROICs and multiplexers; CMOS sensors. Whether your application is characterizing a massive mosaic of CCDs for the next great observatory, designing a faster FLIR for a weapons-guidance system, or production-testing a CMOS image sensor for a digital camera, Pulse Instruments can supply you with a fully-integrated test system that allows you to focus on your your device, not on your test system.

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  • Prop Shaft Torque Measurement Systems

    Advanced Telemetrics International

    ATi Telemetry Systems are typically used to transmit data from rotating shafts or machinery to a stationary receiver. The Miniature Strain Gage Transmitter can be attached to strain gages adhered to your shaft in order to transmit shaft torque and thrust while the system is running.

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  • Systems For Monitoring And Managing Multiservice Networks

    Planar, llc

    Designed to obtain information about the state of the network in operation. The system allows you to organize the protection of operated equipment or other important facilities. The system is open and allows you to increase the necessary functionality as the operator's business develops. Used in optical and coaxial networks.

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  • Multipurpose Mobile PXI DAQ System

    Bloomy Controls, Inc.

    The mobile DAQ system achieves seamless integration among signal conditioning, data acquisition, and synchronization that benchtop instruments would not have achieved. By choosing this system over using benchtop instruments, United Technologies Research Center saved hundreds of thousands of dollars.

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  • Transformer and Reactor Loss Measurement System

    Measurements International Ltd.

    The measurement of electric power and energy at high voltages and currents at low power factors is becoming increasingly important economically as a way to reduce costs in an ever-growing industrial economy. Today the transformer purchaser subjects the transformer manufacturer to an economic penalty for losses that occur in load and no-load conditions. To keep these penalties as low as possible, it is important that the manufacturer accurately measure these losses. Failure to do so can result in the manufacturer losing important contract awards to their competitors who may be utilizing a more accurate system. Using “State of the Art” proven two-stage-currentcomparator technology, the AccuLoss™ Series of transformer loss measurement systems is designed to meet the needs of today’s transformer manufacturer by providing the most accurate power loss measurement system in the world. Designed for power frequency testing and calibration, the AccuLoss™ system can be used for testing small, medium and large power transformers as well as motors and turbines up to 400 Hz. The system is also ideal for R&D facilities. The AccuLoss™ system can also be used to measure losses in single and three phase reactors.

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  • Instrument Systems LED Measurement Accessories

    Konica Minolta Sensing Americas, Inc

    It’s critical to use the appropriate LED measurement equipment and accessories when evaluating an LED’s various photometric and radiometric quantities. Because all of the test adapters Instrument Systems designs are compliant with CIE 127:2007, users are assured of compatibility between measurements. Instrument Systems has a diverse array of LED Measurement Equipment. Whether you are looking to measure average LED intensity or high power LEDs, Instrument Systems has LED test sockets that can meet your requirements. Additionally, the LED-81X/-850 model, normally used for high power LED measurement, is also passively cooled using a thermal fan and sink to ensure the longevity of the Instrument Systems LED measurement equipment and can even be set to have a temperature range of +5 to +85 degrees Celsius to control heating and cooling. Instrument Systems also makes integrating their LED measurement equipment relatively simple requiring minimal calibrations. It is recommended that to completely automate your measuring applications you consider using a software add on that was developed by Instrument Systems for SpecWin Pro.

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  • EMCTD Broadband RF Safety Systems

    LBA Group, Inc

    The EMCTD analog Smart Fieldmeter® is easy to read and to operate. The EMCTD broadband electromagnetic probe covers the 0.2 to 3000 MHz spectrum where most common industrial, communications, medical and government RF emitters are found. The ANGPE-3000  system enables checking of home, office, and workplace RF levels. The system is designed to conveniently measure RF levels around WiFi access points, RFID systems and rooftop antennas; to find transmitter cabinet radiation, locate transmission line leaks, to identify non-radiating antenna elements, and much more. With the supplied NIST-traceable calibration, this system supports laboratory testing of RF devices in compliance with present EMC and RF safety standards.

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  • Battery Conductance and Electrical System Tester

    MDX-P300 - Midtronics, Inc.

    The MDX-P300 is the first tester available from Midtronics which features an integrated printer allowing for immediate printing of test results. Now it is easier than ever to show thecurrent state of the battery and electrical system by providing customers with a printed result of the battery and system test. Using patented Conductance Technology, perform a quick, simple, and accurate battery or system test in seconds, and review the printout with the customer for added impact to preventive maintenance routines and customer service.

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  • Advanced Data Acquisition And Control System

    ADACS - Leonardo DRS, Inc.

    This high-speed damage-control system was built around Arc Fault Detect and Continuous Thermal Monitoring (AFD/CTM) from the Johns Hopkins Applied Physics Laboratory. When AFD/CTM detects dangerous arc faults — powerful discharges of electricity between conductors —  the ADACS system immediately cuts power to the affected circuit before it can damage equipment or injure nearby personnel. Altogether, the system prevents loss of life, preserves countless repair dollars and assures continuous readiness.

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  • Mixed signal LSI test system

    ShibaSoku Co., Ltd.

    Multi-pin type model is now launched in WL27 Logic/Power mixed LSI test system.This system is suitable for multi-site test in A/D mixed device such as automotive・motor driver IC. It’s a high throughput and cost performance mixed signal LSI test system.

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